Reliability Physics And Engineering

Autor: J. W. McPherson
Publisher: Springer Science & Business Media
ISBN: 3319001221
File Size: 60,21 MB
Format: PDF, ePub, Docs
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"Reliability Physics and Engineering" provides critically important information for designing and building reliable cost-effective products. The textbook contains numerous example problems with solutions. Included at the end of each chapter are exercise problems and answers. "Reliability Physics and Engineering" is a useful resource for students, engineers, and materials scientists.

Reliability And Failure Of Electronic Materials And Devices

Autor: Milton Ohring
Publisher: Academic Press
ISBN: 0080575528
File Size: 75,67 MB
Format: PDF, Docs
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Reliability and Failure of Electronic Materials and Devices is a well-established and well-regarded reference work offering unique, single-source coverage of most major topics related to the performance and failure of materials used in electronic devices and electronics packaging. With a focus on statistically predicting failure and product yields, this book can help the design engineer, manufacturing engineer, and quality control engineer all better understand the common mechanisms that lead to electronics materials failures, including dielectric breakdown, hot-electron effects, and radiation damage. This new edition adds cutting-edge knowledge gained both in research labs and on the manufacturing floor, with new sections on plastics and other new packaging materials, new testing procedures, and new coverage of MEMS devices. Covers all major types of electronics materials degradation and their causes, including dielectric breakdown, hot-electron effects, electrostatic discharge, corrosion, and failure of contacts and solder joints New updated sections on "failure physics," on mass transport-induced failure in copper and low-k dielectrics, and on reliability of lead-free/reduced-lead solder connections New chapter on testing procedures, sample handling and sample selection, and experimental design Coverage of new packaging materials, including plastics and composites

Probabilistic Physics Of Failure Approach To Reliability

Autor: Mohammad Modarres
Publisher: John Wiley & Sons
ISBN: 1119388686
File Size: 37,17 MB
Format: PDF, ePub
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The book presents highly technical approaches to the probabilistic physics of failure analysis and applications to accelerated life and degradation testing to reliability prediction and assessment. Beside reviewing a select set of important failure mechanisms, the book covers basic and advanced methods of performing accelerated life test and accelerated degradation tests and analyzing the test data. The book includes a large number of very useful examples to help readers understand complicated methods described. Finally, MATLAB, R and OpenBUGS computer scripts are provided and discussed to support complex computational probabilistic analyses introduced.

Reliability Models For Engineers And Scientists

Autor: Mark P. Kaminskiy
Publisher: CRC Press
ISBN: 1466565934
File Size: 10,91 MB
Format: PDF, ePub, Mobi
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A discussion of the basic reliability concepts and models, Reliability Models for Engineers and Scientists demystifies modern mathematical reliability models. Requiring very little mathematical background on the reader’s part, this concise book introduces the models by focusing on their physical meaning and the supporting data; it then goes on to provide a wide scope of possible applications. The book also introduces a new concept of the Gini-type index, which when applied to aging/rejuvenating components (nonrepairable systems) can measure how different a given aging/rejuvenation distribution is compared to the exponential distribution. A similar index is then applied to aging/rejuvenating repairable systems, creating a bridge between the concepts. The chapters discuss models used in reliability, risk analysis, physics of failure, fracture mechanics, biological, pharmaceutical, and medical studies. They comprise an up-to-date, concise, and informative resource on reliability models, which does not require any special mathematical background.

Practical Reliability Engineering

Autor: Patrick O'Connor
Publisher: John Wiley & Sons
ISBN: 0470979828
File Size: 32,67 MB
Format: PDF
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With emphasis on practical aspects of engineering, this bestseller has gained worldwide recognition through progressive editions as the essential reliability textbook. This fifth edition retains the unique balanced mixture of reliability theory and applications, thoroughly updated with the latest industry best practices. Practical Reliability Engineering fulfils the requirements of the Certified Reliability Engineer curriculum of the American Society for Quality (ASQ). Each chapter is supported by practice questions, and a solutions manual is available to course tutors via the companion website. Enhanced coverage of mathematics of reliability, physics of failure, graphical and software methods of failure data analysis, reliability prediction and modelling, design for reliability and safety as well as management and economics of reliability programmes ensures continued relevance to all quality assurance and reliability courses. Notable additions include: New chapters on applications of Monte Carlo simulation methods and reliability demonstration methods. Software applications of statistical methods, including probability plotting and a wider use of common software tools. More detailed descriptions of reliability prediction methods. Comprehensive treatment of accelerated test data analysis and warranty data analysis. Revised and expanded end-of-chapter tutorial sections to advance students’ practical knowledge. The fifth edition will appeal to a wide range of readers from college students to seasoned engineering professionals involved in the design, development, manufacture and maintenance of reliable engineering products and systems. www.wiley.com/go/oconnor_reliability5

Reliability Engineering And Risk Analysis

Autor: Mohammad Modarres
Publisher: CRC Press
ISBN: 149874589X
File Size: 27,32 MB
Format: PDF, Kindle
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This undergraduate and graduate textbook provides a practical and comprehensive overview of reliability and risk analysis techniques. Written for engineering students and practicing engineers, the book is multi-disciplinary in scope. The new edition has new topics in classical confidence interval estimation; Bayesian uncertainty analysis; models for physics-of-failure approach to life estimation; extended discussions on the generalized renewal process and optimal maintenance; and further modifications, updates, and discussions. The book includes examples to clarify technical subjects and many end of chapter exercises. PowerPoint slides and a Solutions Manual are also available.

Reliability And Risk Models

Autor: Michael Todinov
Publisher: John Wiley & Sons
ISBN: 1118873327
File Size: 78,93 MB
Format: PDF, Kindle
Read: 9754
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New edition comprehensively updated with six new chapters Contents have been reorganised and streamlined to bring greater focus to reliability and risk models Covers new developments (including the Weibull model) Includes a wide range of worked examples Discusses application of models to mechanical and electrical components, and computer networks.

Safety And Reliability Methodology And Applications

Autor: Tomasz Nowakowski
Publisher: CRC Press
ISBN: 1315736977
File Size: 68,93 MB
Format: PDF
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Within the last fifty years the performance requirements for technical objects and systems were supplemented with: customer expectations (quality), abilities to prevent the loss of the object properties in operation time (reliability and maintainability), protection against the effects of undesirable events (safety and security) and the ability to restore performance (resilience). The need to adapt the operation of complex systems in such an uncertain and volatile environment has caused the necessity to formulate new and well established achievements associated with modeling, testing and evaluation of these properties. The concept of a complex system applies not only to the technical ones but also the infrastructure of major importance for social life such as transportation and logistics systems, buildings, power systems, water distribution systems or health services. Safety and Reliability: Methodology and Applications contains the proceedings of the 24th European Safety and Reliability Conference (ESREL 2014, Wroclaw, Poland, 14-18 September 2014), and discusses theories and methods and their applications in the areas of risk, safety and reliability. The abstracts book (408 pages) + full paper CD-ROM (2496 pages) will be of interest to researchers and practitioners, academics and engineers working in academic, industrial and governmental sectors.

Applied Reliability Engineering And Risk Analysis

Autor: Ilia B. Frenkel
Publisher: John Wiley & Sons
ISBN: 1118701895
File Size: 61,22 MB
Format: PDF
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This complete resource on the theory and applications of reliability engineering, probabilistic models and risk analysis consolidates all the latest research, presenting the most up-to-date developments in this field. With comprehensive coverage of the theoretical and practical issues of both classic and modern topics, it also provides a unique commemoration to the centennial of the birth of Boris Gnedenko, one of the most prominent reliability scientists of the twentieth century. Key features include: expert treatment of probabilistic models and statistical inference from leading scientists, researchers and practitioners in their respective reliability fields detailed coverage of multi-state system reliability, maintenance models, statistical inference in reliability, systemability, physics of failures and reliability demonstration many examples and engineering case studies to illustrate the theoretical results and their practical applications in industry Applied Reliability Engineering and Risk Analysis is one of the first works to treat the important areas of degradation analysis, multi-state system reliability, networks and large-scale systems in one comprehensive volume. It is an essential reference for engineers and scientists involved in reliability analysis, applied probability and statistics, reliability engineering and maintenance, logistics, and quality control. It is also a useful resource for graduate students specialising in reliability analysis and applied probability and statistics. Dedicated to the Centennial of the birth of Boris Gnedenko, renowned Russian mathematician and reliability theorist

Esd

Autor: Steven H. Voldman
Publisher: John Wiley & Sons
ISBN: 0470747269
File Size: 62,79 MB
Format: PDF, Kindle
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Electrostatic discharge (ESD) failure mechanisms continue to impact semiconductor components and systems as technologies scale from micro- to nano-electronics. This book studies electrical overstress, ESD, and latchup from a failure analysis and case-study approach. It provides a clear insight into the physics of failure from a generalist perspective, followed by investigation of failure mechanisms in specific technologies, circuits, and systems. The book is unique in covering both the failure mechanism and the practical solutions to fix the problem from either a technology or circuit methodology. Look inside for extensive coverage on: failure analysis tools, EOS and ESD failure sources and failure models of semiconductor technology, and how to use failure analysis to design more robust semiconductor components and systems; electro-thermal models and technologies; the state-of-the-art technologies discussed include CMOS, BiCMOS, silicon on insulator (SOI), bipolar technology, high voltage CMOS (HVCMOS), RF CMOS, smart power, gallium arsenide (GaAs), gallium nitride (GaN), magneto-resistive (MR) , giant magneto-resistors (GMR), tunneling magneto-resistor (TMR), devices; micro electro-mechanical (MEM) systems, and photo-masks and reticles; practical methods to use failure analysis for the understanding of ESD circuit operation, temperature analysis, power distribution, ground rule development, internal bus distribution, current path analysis, quality metrics, (connecting the theoretical to the practical analysis); the failure of each key element of a technology from passives, active elements to the circuit, sub-system to package, highlighted by case studies of the elements, circuits and system-on-chip (SOC) in today’s products. ESD: Failure Mechanisms and Models is a continuation of the author’s series of books on ESD protection. It is an essential reference and a useful insight into the issues that confront modern technology as we enter the Nano-electronic era.